Other spectroscopic methods for graphene characterization

Autor(en)

Toma Susi

Abstrakt

The chemical composition of graphene samples and their dopants, functional groups, and impurities is vital information not only for applications but also for many fundamental studies. Other characterization methods mainly based on core-level techniques including X-ray and electron spectroscopies are the most appropriate tools for determining these properties. Recent advances in synchrotron beamlines and electron spectrometers have brought new and ever more powerful spectroscopic modalities within the reach of the graphene research community. In this chapter, I first briefly discuss the physics of electron and X-ray scattering and then introduce many varieties of photoelectron, X-ray, and electron energy-loss spectroscopies. Understanding the underlying physical phenomena will help the reader evaluate the literature beyond the selected examples given here. The focus will be graphene-specific and practical, with an emphasis on the latest exciting advances. I close the chapter with an outlook on the future developments.

Organisation(en)

Physik Nanostrukturierter Materialien

Seiten

413-436

Anzahl der Seiten

24

DOI

https://doi.org/10.1016/B978-0-08-102848-3.00011-6

Publikationsdatum

11-2020

Peer-reviewed

Ja

ÖFOS 2012

104026 Spektroskopie, 103018 Materialphysik, 210004 Nanomaterialien

Schlagwörter

ASJC Scopus Sachgebiete

Allgemeiner Maschinenbau, Allgemeine Materialwissenschaften

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/cdb273ee-9da2-495e-a833-9cde46492a8a