The role of dislocations for the plastic deformation of semicrystalline polymers as investigated by multireflection X-ray line profile analysis

Autor(en)

Florian Spieckermann, Gerald Polt, Harald Wilhelm, Michael Kerber, Erhard Schafler, Michael Zehetbauer

Abstrakt

Wide angle X-ray experiments evaluated by recent developments of X-ray line profile analysis allow for the detection of the presence of dislocations as well as to determine their density in crystalline materials. The application to semicrystalline polymers not only provides information on the crystal size and the dislocations butin combination with in situ deformationalso information on the evolution of these microstructural parameters. Investigations on cold rolled and on uniaxially compressed samples of a-phase isotactic polypropylene (alpha-iPP) as well as poly(3-hydroxybutyrate) (P3HB) are presented. The synchrotron experiments reveal a dislocation governed deformation process in alpha-iPP center dot P3HB, however, deforms by a process not including dislocation generation. Here, microcracking and strain localization in the amorphous phase seem to be the predominant deformation mechanisms

Organisation(en)

Physik Nanostrukturierter Materialien

Journal

Journal of Applied Polymer Science

Band

125

Seiten

4150-4154

Anzahl der Seiten

5

ISSN

0021-8995

DOI

https://doi.org/10.1002/app.36570

Publikationsdatum

2012

Peer-reviewed

Ja

ÖFOS 2012

210006 Nanotechnologie, 103018 Materialphysik

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/b156f816-ae79-4854-8fa4-1e4bdb4215f3