High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)

Autor(en)

Natalia M. Martin, Jan Knudsen, Sara Blomberg, Johan Gustafson, Jesper N. Andersen, Edvin Lundgren, Harelind H. Ingelsten, Peder A. Carlsson, Magnus Skoglundh, Andreas Stierle, Georg Kresse

Abstrakt

We have studied the ultrathin aluminum oxide film on NiAl(110) by a combination of high-resolution core-level spectroscopy and density functional theory calculations. Energy-dependent core-level data from the O 1s and Al 2p levels allows for a distinction between oxygen and aluminum atoms residing at the surface or inside the aluminum oxide film. A comparison to calculated core-level binding energies from the recent model by Kresse et al. [Science 308, 1440 (2005)] reveals good agreement with experiment, and the complex spectroscopic signature of the thin Al oxide on NiAl(110) can be explained. Our assignment of a shifted component in the O 1s spectra to oxygen atoms at the surface with a particular Al and oxygen coordination may have implications for the interpretation of photoelectron-diffraction experiments from similar ultrathin aluminum oxide films.

Organisation(en)

Computergestützte Materialphysik

Externe Organisation(en)

Lund University, Chalmers University of Technology, Max-Planck-Institut für Metallforschung

Journal

Physical Review B

Band

83

Anzahl der Seiten

5

ISSN

1098-0121

DOI

https://doi.org/10.1103/PhysRevB.83.125417

Publikationsdatum

2011

Peer-reviewed

Ja

ÖFOS 2012

103018 Materialphysik

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/a5d61fe6-9a46-4a4d-a4d1-a56a6843c240