Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene

Autor(en)

Jannik C. Meyer, Franz Eder, Simon Kurasch, Viera Skakalova, Jani Kotakoski, Hye Jin Park, Siegmar Roth, Audrey Chuvilin, Sören Eyhusen, Gerd Benner, A. Krasheninnikov, Ute Kaiser

Abstrakt

We present an accurate measurement and a quantitative analysis of electron-beam-induced displacements of carbon atoms in single-layer graphene. We directly measure the atomic displacement ("knock-on'') cross section by counting the lost atoms as a function of the electron-beam energy and applied dose. Further, we separate knock-on damage (originating from the collision of the beam electrons with the nucleus of the target atom) from other radiation damage mechanisms (e.g., ionization damage or chemical etching) by the comparison of ordinary (C-12) and heavy (C-13) graphene. Our analysis shows that a static lattice approximation is not sufficient to describe knock-on damage in this material, while a very good agreement between calculated and experimental cross sections is obtained if lattice vibrations are taken into account.

Organisation(en)

Physik Nanostrukturierter Materialien

Externe Organisation(en)

Universität Ulm, Max-Planck-Institut für Festkörperforschung, Carl Zeiss NTS GmbH, University of Helsinki, CIC NanoGUNE, Aalto University

Journal

Physical Review Letters

Band

108

Anzahl der Seiten

6

ISSN

0031-9007

Publikationsdatum

2012

Peer-reviewed

Ja

ÖFOS 2012

210006 Nanotechnologie

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/a55bc74f-b7bd-4fa6-b17d-8a06811691f1