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Scanning photoelectron spectromicroscopy: From static to operando studies of functional materials

Autor(en)
M. Amati, Toma Susi, P. Jovičević-Klug, M. Jovičević-Klug, Tomasz Kosmala, Gaetano Granozzi, Stefano Agnoli, Pengfei Yang, Yanfeng Zhang, Mattia Scardamaglia, L. Gregoratti
Abstrakt

The scanning photoelectron microscope (SPEM), developed more than 30 years ago, has undergone numerous technical developments, providing an incredibly vast kind of feasible sample environments, which span from the traditional high spatial resolution core level based chemical analysis to insitu and operando complex experiments, including also electrochemical setups and operational electronic devices at various temperatures. Another important step ahead is overcoming the so-called pressure gap for operando studies, recently extended to near ambient values by building special environmental cells. Using recent results of conventional and unconventional experiments, obtained with SPEM at the ESCA Microscopy beamline at Elettra Sincrotrone Trieste the present review demonstrates the current potential of this type of photoelectron spectromicroscopy to explore the interfacial properties of functional materials with high spatial resolution.

Organisation(en)
Physik Nanostrukturierter Materialien
Externe Organisation(en)
Elettra Sincrotrone Trieste, Max-Planck-Institut für Eisenforschung, Università degli Studi di Padova, Uniwersytet Wrocławski, Peking University, Lund University
Journal
Journal of Electron Spectroscopy and Related Phenomena
Band
265
Anzahl der Seiten
11
ISSN
0368-2048
DOI
https://doi.org/10.1016/j.elspec.2023.147336
Publikationsdatum
05-2023
Peer-reviewed
Ja
ÖFOS 2012
103018 Materialphysik, 104026 Spektroskopie
Schlagwörter
ASJC Scopus Sachgebiete
Electronic, Optical and Magnetic Materials, Radiation, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Spectroscopy, Physical and Theoretical Chemistry
Link zum Portal
https://ucrisportal.univie.ac.at/de/publications/8349dfb9-0d16-4cff-85c4-5d72e26ce048