Die u:cris Detailansicht:
Improved accuracy fullerene polarizability measurements in a long-baseline matter-wave interferometer
- Autor(en)
- Yaakov Y. Fein, Philipp Geyer, Filip Kialka, Stefan Gerlich, Markus Arndt
- Abstrakt
We present electric deflection results for the fullerenes C60 and C70 obtained with a long-baseline matter-wave interferometer. The second grating of the interferometer is interchangeable between a material grating for fast atom beams and an optical phase grating for polarizable molecules. This allows us to use cesium as a calibration particle and thus measure molecular susceptibilities with improved systematic uncertainty. The static polarizabilities of C60 and C70 are measured as 4πɛ0×87.4±0.4±2.5Å3 and 4πɛ0×106.4±0.2±1.1Å3, respectively, in excellent agreement with previous deflection experiments, but with improved uncertainties.
- Organisation(en)
- Quantenoptik, Quantennanophysik und Quanteninformation
- Journal
- Physical Review Research
- Band
- 1
- Anzahl der Seiten
- 4
- ISSN
- 2643-1564
- DOI
- https://doi.org/10.1103/PhysRevResearch.1.033158
- Publikationsdatum
- 12-2019
- Peer-reviewed
- Ja
- ÖFOS 2012
- 103026 Quantenoptik
- Schlagwörter
- ASJC Scopus Sachgebiete
- Allgemeine Physik und Astronomie
- Link zum Portal
- https://ucrisportal.univie.ac.at/de/publications/7ff0d6fa-1016-49d5-8a73-18f49d906977