Advances in microstructural investigation using the REM-ECC-imaging technique

Autor(en)

C Stickler, Dana Melisova, Bernhard Mingler, Brigitte Weiss, Roland Stickler

Abstrakt

With the improvements made in Scanning Electron Microscopy (SEM) it is now possible, using the Electron-Channelling-Contrast-Imaging (ECCI) technique, to image the global arrangement of dislocations in metallic materials. This type of investigation is complementary to imaging by diffraction contrast in the Transmission Electron Microscope (TEM) and in comparison requires less specimen preparation. Using the ECCI-technique, it is possible to examine almost the whole of the electro-polished surface of a solid specimen of magnifications of up to 10,000 times. In addition, using Selected-Area-Channelling-Diagrams (SACP), the orientation of areas of the specimen less than 30 œm in diameter can be determined. In doing this, there is no requirement to tilt the specimen, the orientation being related directly to the ECC-image. Following a short description of the SEM-ECC imaging process, its possible uses are illustrated with reference to actual practical examples.

Organisation(en)

Physik Nanostrukturierter Materialien

Externe Organisation(en)

Universität Wien

Journal

Praktische Metallographie = Practical metallography

Band

38

Seiten

19-30

Anzahl der Seiten

12

ISSN

0032-678X

Publikationsdatum

2001

Peer-reviewed

Ja

ÖFOS 2012

104017 Physikalische Chemie

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/e5473462-0493-4932-8455-be6b5accb203