Full-field cavity enhanced microscopy techniques

Autor(en)

Stefan Nimmrichter, Chi-Fang Chen, Brannon B. Klopfer, Mark A. Kasevich, Thomas Juffmann

Abstrakt

The number of probe particles that is detected on a single pixel of a micrograph is finite, either due to source (low power), detector (low dynamic range) or specimen damage constraints. The sensitivity of an otherwise perfect microscope is then limited by the statistical fluctuations in the number of detected particles. It is thus crucial to strive for the optimal signal-to-noise ratio per detected photon. Here we analytically and numerically compare three different contrast enhancing techniques that are all based on self-imaging cavities: CW cavity enhanced microscopy, cavity ring-down microscopy and multi-pass microscopy. We show that all three schemes can lead to sensitivities beyond those achievable with a single pass.

Organisation(en)

Quantenoptik, Quantennanophysik und Quanteninformation, Department für Strukturbiologie und Computational Biology

Externe Organisation(en)

National University of Singapore (NUS), Stanford University, Max F. Perutz Laboratories GmbH (MFPL)

Journal

JPhys Photonics

Band

1

Anzahl der Seiten

16

ISSN

2515-7647

DOI

https://doi.org/10.1088/2515-7647/aae228

Publikationsdatum

12-2018

Peer-reviewed

Ja

ÖFOS 2012

103021 Optik

Schlagwörter

ASJC Scopus Sachgebiete

Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/562406ff-4ac0-41fa-aeab-a6768322184c