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Atomic structure from large-area, low-dose exposures of materials

Autor(en)
Jannik C. Meyer, Jani Kotakoski, Clemens Mangler
Abstrakt

Beam-induced structural modifications are a major nuisance in the study of materials by high-resolution electron microscopy. Here, we introduce a new approach to circumvent the radiation damage problem by a statistical treatment of large, noisy, low-dose data sets of non-periodic configurations (e.g. defects) in the material. We distribute the dose over a mixture of different defect structures at random positions and with random orientations, and recover representative model images via a maximum likelihood search. We demonstrate reconstructions from simulated images at such low doses that the location of individual entities is not possible. The approach may open a route to study currently inaccessible beam-sensitive configurations.

Organisation(en)
Physik Nanostrukturierter Materialien
Journal
Ultramicroscopy
Band
145
Seiten
13-21
Anzahl der Seiten
9
ISSN
0304-3991
DOI
https://doi.org/10.1016/j.ultramic.2013.11.010
Publikationsdatum
12-2013
Peer-reviewed
Ja
ÖFOS 2012
210006 Nanotechnologie, 103008 Experimentalphysik, 103009 Festkörperphysik
Schlagwörter
ASJC Scopus Sachgebiete
Electronic, Optical and Magnetic Materials, Instrumentation, Atomic and Molecular Physics, and Optics
Link zum Portal
https://ucrisportal.univie.ac.at/de/publications/55cfd028-5caf-469f-b1f5-1b395b000799