Die u:cris Detailansicht:
Atomic structure from large-area, low-dose exposures of materials
- Autor(en)
- Jannik C. Meyer, Jani Kotakoski, Clemens Mangler
- Abstrakt
Beam-induced structural modifications are a major nuisance in the study of materials by high-resolution electron microscopy. Here, we introduce a new approach to circumvent the radiation damage problem by a statistical treatment of large, noisy, low-dose data sets of non-periodic configurations (e.g. defects) in the material. We distribute the dose over a mixture of different defect structures at random positions and with random orientations, and recover representative model images via a maximum likelihood search. We demonstrate reconstructions from simulated images at such low doses that the location of individual entities is not possible. The approach may open a route to study currently inaccessible beam-sensitive configurations.
- Organisation(en)
- Physik Nanostrukturierter Materialien
- Journal
- Ultramicroscopy
- Band
- 145
- Seiten
- 13-21
- Anzahl der Seiten
- 9
- ISSN
- 0304-3991
- DOI
- https://doi.org/10.1016/j.ultramic.2013.11.010
- Publikationsdatum
- 12-2013
- Peer-reviewed
- Ja
- ÖFOS 2012
- 210006 Nanotechnologie, 103008 Experimentalphysik, 103009 Festkörperphysik
- Schlagwörter
- ASJC Scopus Sachgebiete
- Electronic, Optical and Magnetic Materials, Instrumentation, Atomic and Molecular Physics, and Optics
- Link zum Portal
- https://ucrisportal.univie.ac.at/de/publications/55cfd028-5caf-469f-b1f5-1b395b000799