Atomic structure from large-area, low-dose exposures of materials

Autor(en)

Jannik C. Meyer, Jani Kotakoski, Clemens Mangler

Abstrakt

Beam-induced structural modifications are a major nuisance in the study of materials by high-resolution electron microscopy. Here, we introduce a new approach to circumvent the radiation damage problem by a statistical treatment of large, noisy, low-dose data sets of non-periodic configurations (e.g. defects) in the material. We distribute the dose over a mixture of different defect structures at random positions and with random orientations, and recover representative model images via a maximum likelihood search. We demonstrate reconstructions from simulated images at such low doses that the location of individual entities is not possible. The approach may open a route to study currently inaccessible beam-sensitive configurations.

Organisation(en)

Physik Nanostrukturierter Materialien

Journal

Ultramicroscopy

Band

145

Seiten

13-21

Anzahl der Seiten

9

ISSN

0304-3991

DOI

https://doi.org/10.1016/j.ultramic.2013.11.010

Publikationsdatum

12-2013

Peer-reviewed

Ja

ÖFOS 2012

210006 Nanotechnologie, 103008 Experimentalphysik, 103009 Festkörperphysik

Schlagwörter

ASJC Scopus Sachgebiete

Electronic, Optical and Magnetic Materials, Instrumentation, Atomic and Molecular Physics, and Optics

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/55cfd028-5caf-469f-b1f5-1b395b000799