Optical Near-Field Electron Microscopy

Autor(en)

Raphaël Marchand, Radek Šachl, Martin Kalbáč, Martin Hof, Rudolf Tromp, Mariana Amaro, Sense J. van der Molen, Thomas Juffmann

Abstrakt

The imaging of dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical techniques damage the specimen and cause dose-induced artifacts. Here, optical near-field electron microscopy (ONEM) is proposed, an imaging technique that combines noninvasive probing with light, with a high-spatial-resolution readout via electron optics. Close to the specimen, the optical near fields are converted into a spatially varying electron flux using a planar photocathode. The electron flux is imaged using low-energy electron microscopy, enabling label-free nanometric resolution without the need to scan a probe across the sample. The specimen is never exposed to damaging electrons.

Organisation(en)

Quantenoptik, Quantennanophysik und Quanteninformation, Department für Strukturbiologie und Computational Biology

Externe Organisation(en)

Czech Academy of Sciences, IBM T. J. Watson Research Center, Leiden University, Vienna Center for Quantum Science and Technology (VCQ)

Journal

Physical Review Applied

Band

16

Anzahl der Seiten

8

ISSN

2331-7019

DOI

https://doi.org/10.1103/PhysRevApplied.16.014008

Publikationsdatum

07-2021

Peer-reviewed

Ja

ÖFOS 2012

103042 Elektronenmikroskopie, 103021 Optik, 103018 Materialphysik

ASJC Scopus Sachgebiete

Allgemeine Physik und Astronomie

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/3b898bbe-4a57-457e-887c-a860fc616e68