Electron optics for a multi-pass transmission electron microscope

Autor(en)

Marian Mankos, Stewart A. Koppell, Brannon B. Klopfer, Thomas Juffmann, Vladimir Kolarik, Khashayar Shadman, Mark Kasevich

Abstrakt

Multi-pass transmission electron microscopy is a novel technique that promises to reduce the required electron dose to the specimen for a desired signal-to-noise ratio by increasing the change to the phase of the electron wave that is imparted by the specimen. In this technique, the electron beam interacts elastically with the specimen multiple times so that the change in the phase accumulates before reaching the detector. Past simulations have predicted an improvement in resolution and sensitivity for a range of applications, and an order-of-magnitude reduction in damage at equivalent resolution. Here, the electron-optical design of a 10 keV multi-pass transmission electron microscope that is currently under construction is examined.

Organisation(en)

Quantenoptik, Quantennanophysik und Quanteninformation

Externe Organisation(en)

Electron Optica, Stanford University, Delong Instruments, Max F. Perutz Laboratories GmbH (MFPL)

Seiten

71-86

Anzahl der Seiten

16

DOI

https://doi.org/10.1016/bs.aiep.2019.08.003

Publikationsdatum

2019

Peer-reviewed

Ja

ÖFOS 2012

103042 Elektronenmikroskopie

Schlagwörter

ASJC Scopus Sachgebiete

Nuclear and High Energy Physics, Condensed Matter Physics, Electrical and Electronic Engineering

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/3b23df48-243e-4284-9a1d-5802114b3eac