Quantitative local profile analysis of nanomaterials by electron diffraction

Autor(en)

Christoph Gammer, Clemens Mangler, Christian Rentenberger, Hans-Peter Karnthaler

Abstrakt

A method yielding a quantitative profile analysis from electron diffraction is worked out and combined with the local information gained from transmission electron microscopy images; it is applicable to various nanomaterials. As an example, small nanocrystalline regions are analyzed that form in FeAl by severe plastic deformation. The result is unexpected as the coherently scattering domain size does not change as a function of strain. At high strains, the sample is homogeneously nanocrystalline and the results agree well with those of X-ray diffraction.

Organisation(en)

Physik Nanostrukturierter Materialien

Journal

Scripta Materialia

Band

63

Seiten

312-315

Anzahl der Seiten

4

ISSN

1359-6462

DOI

https://doi.org/10.1016/j.scriptamat.2010.04.019

Publikationsdatum

2010

Peer-reviewed

Ja

ÖFOS 2012

103023 Polymerphysik, 210006 Nanotechnologie, 103018 Materialphysik

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/32368b5b-9a88-4ba5-bb7f-82927b39c73d