Application of quantitative modal analysis for investigation of thermal degradation of microelectronic packages

Autor(en)

P. Rafiee, G. Khatibi, N. Nelhiebel, R. Pelzer

Abstrakt

The influence of high temperature storage on the properties of epoxy based materials in microelectronic packages was investigated by application of a quantitative modal analysis technique. An electromagnetic shaker in combination with scanning laser Doppler vibrometry was used to extract the alteration of the modal response of the components in relationship with the thermal aging time. Data analysis was accomplished by the error ratio (ER) method, modal assurance criterion (MAC) and determination of an aspect ratio (AR) using an image correlation technique. Increasing the storage time resulted in a higher degree of degradation which was reflected by an increase in the values of ER, MAC and the AR. Microstructural investigations confirmed that alteration of the modal response is related to the temperature dependent gradual degradation and modification of the properties of the packaging material which was supported by finite element analysis. This present work shows the feasibility of modal analysis as an efficient and quantitative non-destructive testing method for evaluation of degradation of electronic packages.

Organisation(en)

Physik Nanostrukturierter Materialien

Externe Organisation(en)

Infienon Technol Austria

Journal

Microelectronics Reliability

Band

53

Seiten

1563-1567

Anzahl der Seiten

5

ISSN

0026-2714

DOI

https://doi.org/10.1016/j.microrel.2013.07.028

Publikationsdatum

2013

Peer-reviewed

Ja

ÖFOS 2012

210006 Nanotechnologie, 103018 Materialphysik

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/1d1aa1a1-6c86-42ea-9324-b882856cd285