Three-Dimensional Analysis by Electron Diffraction Methods of Nanocrystalline Materials

Autor(en)

Christoph Gammer, Clemens Mangler, Hans-Peter Karnthaler, Christian Rentenberger

Abstrakt

To analyze nanocrystalline structures quantitatively in 3D, a novel method is presented based on electron diffraction. It allows determination of the average size and morphology of the coherently scattering domains (CSD) in a straightforward way without the need to prepare multiple sections. The method is applicable to all kinds of bulk nanocrystalline materials. As an example, the average size of the CSD in nanocrystalline FeAl made by severe plastic deformation is determined in 3D. Assuming ellipsoidal CSD, it is deduced that the CSD have a width of 19 +/- 2 nm, a length of 18 +/- 1 nm, and a height of 10 +/- 1 nm.

Organisation(en)

Physik Nanostrukturierter Materialien

Journal

Microscopy and Microanalysis

Band

17

Seiten

866-871

Anzahl der Seiten

6

ISSN

1431-9276

DOI

https://doi.org/10.1017/S1431927611011962

Publikationsdatum

2011

Peer-reviewed

Ja

ÖFOS 2012

210006 Nanotechnologie, 103018 Materialphysik

Link zum Portal

https://ucrisportal.univie.ac.at/de/publications/05eef698-820f-4c33-b613-40a242d2123c